Feature Selective Validation Analysis applied to The Measurement of Electronic Circuit Electromagnetic Conducted Emissions - CISPR 25

This paper proposes to investigate, with physical measurements, the layout influence of two PCB boards from the viewpoint of conducted emission. Two solid state H-bridges, with identical schematics but different layouts were tested. In this paper, a correlation plan of the actual measurements focusing on the conducted emissions (CISPR-25) is proposed. In order to evaluate the measurements in a more objective way, the comparisons were quantitatively evaluated using the Feature Selective Validation (FSV) algorithm, which has a good acceptance for the comparison between simulation and measurement results in the EMC/EMI area. This method allows the analysis of amplitude and frequency characteristics of an arbitrary waveform showing the correlation and, in this experiment, determine if it is possible to minimize the effect of the conducted emission by layout modification or if the differences are so small that a modification is not justified. So, the use o FSV correlation methodology in this work helps determine if the measurements in both layouts have a reasonable correlation.