Challenges and solution approaches for simulation-based reliability assessment – degradation modeling

To verify the reliability of electronic circuits and systems in automotive applications, qualification according to the industry-standards, such as AEC-QIOO, is state of the art. But will it be sufficient for future applications? Simulationbased reliability assessments in IC and system development are intended to complement qualification and allow efficient investigations of product reliability. Aging simulations for analog circuits have been available for years, but are hardly used. This article discusses degradation models as one bottleneck, outlines different requirements and approaches, and points to standards that could be a future solution.