Prediction of Average Si Temperature inside BPD under lightning Surge by Electric and Temperature Coupled Model

One of the causes of global warming is carbon dioxide, and in recent years attention is being paid to solar energy as a clean energy measure. However, failures that cause the photovoltaic system to break due to lightning damage and lead to fires are also attracting attention. It has been found that bypass diode (BPD) suffers from heat generation mode failure due to lightning surge. In this paper, the purpose of this study is to confirm the average temperature and temperature distribution inside the BPD when a failure occurs, in order to elucidate the failure mechanism.