A Novel Bayesian Algorithm for Reliability of Exponential Model under Zero Failure Environment

With the development of science and technology, the quality and lifetime of products become more better, and in type-I life testing, zero-failure data often occurs, especially in some high reliability and small sampling tests. Therefore the problem of zero-failure data becomes a new research hot topic in the reliability engineering. The aim of this paper is to observe the reliability estimation of the exponential distribution using a novel Bayesian algorithm. The new algorithm constructs the prior distribution of the reliability parameter on the basis of the memoryless property of exponential distribution. Bayesian estimators are derived under symmetric entropy loss function. At last, a practical example shows that the effectiveness of the proposed estimators.