Performance of Electric Near-Field Probes for Immunity Tests

This work investigates the performance of electric nearfield probes, either realized by PCBs or semi-rigid coaxial cables, for immunity testing at PCB level. To this end, full-wave simulations and measurements are exploited to thoroughly investigate the performance of the probes in terms of coupling effectiveness, spatial resolution, impact of probe-to-trace gap, and rated power. Advantages and limitations of the two types of probes are eventually discussed.