Bayesian Based Data Analysis Method for Reliability Prediction of Electronics

A Bayesian based data analysis method is proposed to fulfill the modification of basic failure rate of electronic component or optimization of reliability prediction for electronics, combining the data from prediction handbook and field. Analysis process and data requirement are given in detail, as well as two brief cases to demonstrate its feasibility, with Exponential and Weibull distribution assumption respectively. The method can be used to reduce the error caused by prediction handbook and improve the reliability design decision for electronics.