Two-port integrated planar devices frequency characterization

The characterization of two-port integrated planar devices operating at low frequencies (less than a few tens of MHz) is a new challenge nowadays. This paper presents integrated inductors characterization results performed by using an impedance-meter. By only measuring impedances and admittances with one-port method, it is possible to obtain the matrices of a two-port device. Subsequently, by using electrical model of the device the electronic properties of the component can be determined.