Research on Pulsed Laser Induced Single Event Effect for High-Speed Serial Interface

Using single event effect sensitivity evaluation test method and test system as well as pulsed laser simulation sources, the SEE sensitivity of High-Speed Serial Interface was experimentally researched. The test results show that the JESD204B high-speed serial transmitter has strong resistance to single-event upset(SEU). The single-event upset sensitive area map of the JESD204B high-speed serial transmitter was obtained through experiments. The single-event upset sensitive unit of the device was located, which provided guidance for the design of high-speed serial interface chips strengthened by radiation resistance.