High Resolution Magneto-optical Microscopy of Bi:YIG-thin Films with Both Domains and Topography Characterization

Magneto-optical microscopy is a widely used method for magnetic domain structure characterization. Faraday effect allows to investigate transparent magnetic samples. Magnetooptical microscopy has many advantages but also has a limitation caused by diffraction limit of the light. Authors proposed to improve optical resolution of magneto-optical microscopy by using aperture probe for lighting up the sample. Comparison of different types of probes was permed and aperture cantilever probe with carbon tip was chosen for the experiment. Authors show possibility to obtain not only magneto-optical contrast but also morphology information by detecting probe displacement caused by sample-probe interaction. Authors measured Bi:YIG-thin films by high resolution magneto-optical microscopy. Images of domain with subdomain structure and topography were obtained by proposed method.