Discrete 1Ω Probe by Using Flip-Chip IPD Resistor and Amplifier for Inspecting EMI of a Packaged IC

A 1Ω probe for EMI test is implemented by using a flip-chip integrated passive device (IPD) resistor and a commercial amplifier. Comparing with the conventional 1Ω probe composed of only the passive resistors (a 1-Ω plus a 49-Ω resistor), the proposed 1Ω probe exhibits better gain and noise performance. With the improved sensitivity, it could be helpful for detecting the suspicious EMI of a packaged IC.