Effects of interface trap charges on the electrical characteristics of back-gated 2D Negative Capacitance FET

In this work, a fully analytical compact drain current model of back-gated two-dimensional (2D) negative capacitance (NC) FET including interface trap charges has been developed by solving Poisson's, drift-diffusion and 1-D Landau-Khalatnikov equations, and it is validated against the experimental data. In addition, the impact of interface trap charges on the electrical characteristics of the back-gated 2D NC-FET is investigated systematically based on the model. It is found that the subtresdhold swing (SS) and on-off current ration (I
_on
/I
_off
) are seriously degraded because of the presence of interface traps at 2D channel/oxide interface and 2D NC-FET with a big t
_f
is more immune to the degradation induced by the interface traps.