Wavelength Characteristics of a Silicon Waveguide Mach-Zehnder Interferometer having a Ce:YIG cladding

Ce:YIG thin films deposited on the silicon substrates were fabricated and their crystalline quality was investigated. In addition, a silicon waveguide Mach-Zehnder interferometer having a crystallized Ce:YIG cladding was fabricated. The transmitted wavelength characteristic of the device was observed to be different depending on the magnetostatic field direction.