Powerful topographic analyzing technique using Fast Fourier Transform for c-Si solar cells and emerging technologies

Light management of a solar cell can be enhanced by improving Jsc with proper texturing. Topographic images obtained by confocal laser microscopy or AFM are used to study the roughness of textured surfaces. Fast Fourier Transform is employed to separate and select spatial frequencies, which will be analyzed through MountainsMap®. Various kind of samples can be studied such as textured c-Si solar cells or even tandem devices made of perovskite grains evaporated on Si pyramids. The structural, morphological and geometrical results can be extracted in a fast, automatic and repeatable way with a good throughput to enable statistical analysis.