Reliability Analysis of Embryonic Electronic Array in Cold Standby

Existing reliability model of embryonic electronic array (EA) is not suitable for EA in cold standby. The model of series system with cold standby parts (SSC) is proposed. According to the memoryless property of exponential distribution and the additivity of gamma distribution, reliability models of SSC is deduced. Experiments are conducted on 4 random EAs. Three methods are chosen to be compared, such as Monte-Carlo method, k out of n, SSC. Experimental results show that SSC can measure the reliability for cold standby, similar to that of Monte-Carlo. But k out of n can't efficiently measure the reliability for cold standby. In addition, The SSC and k out of n exactly measures the reliability varied in layout of working cell, which can be further used to optimize the array design.