An In-line Failure Analysis System Based on IR Thermography Ready for Production Line Integration

In this study we present the capabilities of an infrared failure analysis system to (automatically) detect defects in various samples from different fields of application in electronic industries. For this purpose, we developed a production line simulator with a sample transfer via conveyor belt and an integrated pulsed infrared thermography system. With this device it can be shown that such a system can reach a similar accuracy as the conventionally used scanning acoustic microscopy in detecting delamination and voids in sinter layers, molding compounds and composites, but with a higher applicability in industry as an in-line inspection system, since it is contactless and no coupling medium is needed.