Construction Method of Device Model of Proton SEU Analysis Based on Heavy Ion Test Data

Some key parameters of model used in proton SEU cross section simulation are not easy to get. By setting sub-volume collecting efficiency and dimension from heavy ion test data, a model totally based on heavy ion test data is established, which is independent of critical charge. The modeling method is verified by heavy ion and proton test data of Xilinx XC2V1000 and XC4VSX55 FPGA. The difference of proton SEU cross section between simulation result with the established model and test data is less than 41% above 40MeV of proton.