Efficient Simulations of Field-to-PCBs Coupling Under Random Excitation

The reverberation chamber can be used for the analysis of the behavior of a device under test irradiated by a random excitation such as plane waves. The finite-diffence time-domain method is adopted in order to analyze this behavior by using a summation of random plane waves instead of simulating the whole chamber. The considered device is a simple PCB, stressed by random source provided by this superposition.