Characterization of ESD Shielding Bag with Capacitive Probe and IEC 61000-4-2 Generator

ESD sensitive devices inside protective packaging may be exposed to high stress levels outside ESD protected area. ESD shielding bags are therefore tested with realistic stress levels by a system level ESD generator. The aim of this study is to estimate statistical uncertainty of ESD shielding measurements with different ESD generators and a capacitive probe.