OCM-PUF: organic current mirror PUF with enhanced resilience to device degradation

In this work, we proposed an organic PUF circuit using a current mirror structure, and evaluated its performance through test chip fabrication. The proposed PUF circuit is resilient against the deterioration of organic devices, which is currently unavoidable. Through the measurements of OCM-arrays, the operation of the proposed PUF is confirmed. The PUF metrics and their temporal changes are also evaluated through measurements.