Polarization measurement method of semiconductor laser

In this paper, the polarization degree of semiconductor laser device in COS package form is measured according to the principle of collimation lens, the light characteristics of polarized beam splitter and the characteristics of wave plate can change the polarization state of laser beam, and the device and measurement method of measuring system for polarization degree of 808nm semiconductor laser device are described, and the purpose of the polarization test and the factors affecting the polarization degree.