Auger Transport of Noninteracting Carriers

We solve minority-carrier transport exactly by assuming a new lifetime model based on free-carrier Auger lifetime and constant diffusivity,D
_A
, at high dopings. A new exact expression for saturation current density is derived, which fits measured data in reported sets of metal-coated n
⁺
and p
⁺
emitters at D
_A
-value consistent with diffusivity data at high dopings. The lifetime model is shown to be consistent with lifetime data.