Dielectric constant and loss-tangent extraction using near-field technology and phase delay method

In this paper, the verifications of two extraction methods for the electrical properties (dielectric constant: 8r and loss-tangent: tanδ) are presented. To verify the two extraction methods (Near-Field Technology method and Phase Delay method), a microstrip line is adopted to calculate the wavelength in dielectric for electrical properties comparison. According to the comparison results, both two extraction methods are well-correlated, also the microstrip line simulation with extracted the electrical properties shows good consistence in Insertion Loss and Return Loss with real sample. Finally, the suitability of the two extraction methods is proved for material electric properties.