The monitoring evolutionary algorithm in device production testing

There is Test Data Robustness (TDR) judgment issue in device production testing process. Part Average Testing guideline (PAT) is proposed to fix this issue through tight limits establishment in automotive device testing. In this paper, a new Monitoring Algorithm (MA) is proposed based on the frame of Evolutionary Strategy (ES) and set Complex Process Capability Index (CPK) as constraint condition to be suited for consumer integrated circuits (IC). The issue test data simulation result displays the ratio of detection to abnormal data is 97.4% while the dynamic PAT is invalid on same data.