Removing ocular artefacts in EEG signals by using combination of complete EEMD (CEEMD) — Independent Component Analysis (ICA) based outlier data

Electroencephalograph (EEG) is brain activity measurement technique that it is widely used by placing electrode on the scalp. The EEG recording signals are vulnerably contaminated by noise. Thus, it can lead to misperception in analyzing EEG signals. One of the noise that has major influence on the recorded EEG signals is ocular artifacts (OAs). In this paper, a new method to remove OAs automatically is proposed by combining between Complete Ensemble Empirical Mode Decomposition (CEEMD) and Independent Component Analysis (ICA). CEEMD-ICA-OD removes OAs based on the concentration of noise that is calculated by calculating entropy for every CEEMD decomposition. Every selected decomposition of CEEMD will be used as input to the ICA method. Then, ICA will decompose selected CEEMD decomposition into independent components (ICs). Then, Chauvenet Criterion (CC) as Outlier Detection (OD) method is used to detect OAs pattern. Every detected OAs pattern will be eliminated by zeroing process on OAs pattern so that the EEG signal information remains secure. The proposed method were compared with Empirical Mode Decomposition (EMD), Ensemble EMD (EEMD) and Complete EEMD (CEEMD) with zeroing ICA combination for every comparison method. The performance measure of the proposed method and the benchmark method is calculated by using Root Mean Square Error (RMSE) and Signal to Noise Ratio (SNR) to show the performance quality in eliminating OAs. The experiment results show that the proposed method is successfully removing OAs better than the other methods with RMSE value and SNR value are 0.2491 and -0.3449, respectively.