Influence of e-beam irradiation on optical properties of Cu6PS5I-based superionic thin films

Cu
₆
PS
₅
I-based thin films were deposited by nonreactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of e-beam irradiated Cu
₆
PS
₅
I-based thin films were measured depending on electron fluence. With electron fluence increase the red shift of the short-wavelengt part of transmission spectra and interference maxima were observed. Urbach absorption edge and dispersion of refractive index for e-beam irradiated Cu
₆
PS
₅
I-based thin films were studied. Under the influence of e-beam irradiation the decrease of the energy pseudogap as well as the increase of the Urbach energy and refractive index were revealed. Influence of e-beam irradiation on the optical parameters and disordering processes in Cu
₆
PS
₅
I-based thin films was analyzed.