Comparison between L-2L and thru-reflect-line de-embedding methods for W-band CMOS amplifier design

L-2L de-embedding method was proved accurate at millimeter-wave (mm-wave) frequencies around 60GHz. However, it was never quantitatively compared to a more complicated method at frequencies as high as 100GHz. In this paper, L-2L and TRL de-embedding methods are compared by applying both on test structures fabricated using CMOS 65nm process. More focus will be given to the W-band frequencies by comparing the measurement results of a W-band amplifier with simulation results that are based on both of the de-embedding methods.