Process variation immune and energy aware sense amplifiers for resistive non-volatile memories

Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) has been explored as a post-CMOS technology for embedded and data storage applications seeking non-volatility, near-zero standby energy, and high density. Towards attaining these objectives for practical implementations, various techniques to mitigate the specific reliability challenges associated with STT-MRAM elements are surveyed, classified, and assessed herein. Some solutions to the reliability issues identified are addressed to realize reliable STT-MRAM designs. In an attempt to further improve the process variation immunity of the Sense Amplifiers (SAs), two new SAs are introduced: Energy Aware Sense Amplifier (EASA) and Variation Immune Sense Amplifier (VISA). Results have shown that EASA and VISA achieve superior performance in most cases compared to two of the most common SAs, namely PCSA and SPCSA respectively, while reducing Bit Error Rate (BER) and increasing reliability.