Explicit Semianalytical Expressions of Sensitivity Matrices for the Reconstruction of 1-D Planarly Layered TI Media Illuminated by 3-D Sources

In this communication, the sensitivity matrices for the reconstruction of 1-D planarly layered transverse isotropic (TI) media illuminated by electromagnetic wave excited by 3-D electric or magnetic current sources are derived based on the transmission-line network analogy. The elements of the matrices are expressed analytically in the vertical
$\textit {z}$
-direction but are in the form of Sommerfeld integration in the horizontal
$xy$
-plane. The derived expressions are useful for the inversion of dielectric parameters and boundary positions of 1-D layered TI media.