True random number generator using current difference based on a fractional stochastic model in 40-nm embedded ReRAM

We have successfully developed a robust ReRAM true random number generator, using current difference, that does not require extra chip area. True random numbers are guaranteed by the current difference in the 1/f
^β
noise generated by Brownian motion, as tested using a fractional SDE model and verified using 1/f
^β
noise distribution. A highly reliable 40-nm ReRAM true random number generator circuit was designed and passed NIST SP800-22 randomness tests across all combinations of voltage (VDD ± 0.1 V) and temperature (-40 to 125 °C). The random number throughput achieves 32 Mbps with a low power consumption of 0.04 nJ/bit.