EMC susceptibility characterization of an operational amplifier-based circuit combining different technique

This paper deals with the immunity analysis of a commercial operational amplifier-based (OpAmp) voltage buffer circuit using different immunity measurement conducted and radiated technique as DPI (Direct Power Injection), TEM (Transverse Electro-Magnetic) cell and NFS (Near-Field Scan) measurements. The frequency range is 100 to 1000 MHz. The aim is to associate the different results (or in the contrary, highlight discrepancies) in order to provide a good understanding of the component's immunity.