Extended multi-structure local binary pattern for high-resolution image scene classification

This paper presents a novel extended multi-structure local binary pattern (EMSLBP) approach for high-resolution image classification, generalizing the well-known local binary pattern (LBP) approach. In the proposed EMSLBP approach, three-coupled descriptors with multi-structure sampling are proposed to extract complementary features (pixel value and radial difference) from local image patches. The anisotropic features derived from elliptical sampling are also rotation invariant by averaging the histograms over rotational angles and combined with the isotropic features extracted from circular sampling. Experimental results show that the proposed method can effectively capture local spatial pattern and local contrast, consistently outperforming several state-of-the-art classification algorithms.