Sensitivity analysis of multiport S-parameter due to non-ideal TRL calibration standards

In this paper a detailed analysis of multiport vector network analyzer (VNA) measurement uncertainties due to non-ideal calibration standards for TRL calibration is presented. Using the concept of general node equations, the error correction equation is simplified by the matrix operation, thus a generalized formula for the deviations of the measured S-parameters with respect to the error terms can be deduced. The final expressions for the sensitivity coefficients with simple and clear form provide us a deeper insight into the error propagation mechanisms.