Fault coverage analysis using fault model and functional testing for DPM reduction

In today's fast growing and increasing complex world of VLSI circuits, test quality has significant effect on the quality of the product. A malfunctioning circuit is a result of design flaw, manufacturing defects or both. Testing is used as a measure to estimate the quality of design. High quality testing minimizes defect-per-million (DPM) and thus can significantly reduce manufacturing costs and increase product yield. Automatic test pattern generator (ATPG) is one of the structural methods used to get good coverage.