Normalization and Correction Factors for Magnetic Tunnel Junction Sensor Performances Comparison

In this manuscript we propose a calculation method where the magneto-resistive elements are modelled as fluctuating resistances to correct the output voltage noise of magnetic tunnel junction (MTJ) from standard electronic circuits. This method is validated on single elements, partial and full Wheatstone bridge circuits, giving rise to a correction factor affecting the output voltage noise as well as sensitivity values. Combining the correction factor and a normalization by the number of MTJs pillars and the pillar surface, we show that the performances extracted by this method allow universal comparison between any results from literature.