Method for improving alignment of angle-polished fibers to silicon photonic waveguides

A novel method for measuring rotation of angle-polished optical fiber for applications of packaging sub-micrometer silicon waveguides is presented. Experimental results show a high correlation between the actual angle and the measured angle using the new technique, with a resolution of 0.14 degrees achievable, which confirms the validity of this technique for packaging grating coupled silicon waveguides with minimal insertion loss.