A Deembedding Method for the S-Parameter Extraction of Surface-Mounted Devices With Asymmetric Fixtures

This letter presents a deembedding method for the S-parameter extraction of surface-mounted devices (SMDs) with asymmetric fixtures. The proposed method can remove the effects of asymmetric fixtures on the SMDs. It extracts the unknown S-parameters of the fixtures and SMD by combining frequency and time domains S-parameters. The accuracy of the proposed method is compared to that of the traditional 2X-thru deembedding method. The advantage of the proposed method is that it can reduce the testing time for asymmetric fixtures. Numerical examples and measurement are carried out for the validation of the proposed deembedding method.