1-Thru Deembedding Method for One-Port Microwave Device Characterization

In this letter, a 1-thru deembedding method for one-port microwave device characterization is presented. Only one standard “thru” is used in the proposed deembedding process. Reliable device models can be developed by the proposed method for EM/circuit cosimulation. The proposed method is verified by the deembedding process of a surface-mount p-i-n diode. Furthermore, the deembedded results are utilized in the EM/circuit cosimulation of a reconfigurable filter. The reconfigurable filter is fabricated and measured for verification. Good agreement is achieved between the experimental and simulated results.