In-pixel calibration of temperature dependent FPN for a wide dynamic-range dual-capture CMOS image sensor

This paper proposes a novel in-pixel calibration method of temperature dependent fixed pattern noise (FPN) for a wide dynamic range dual-capture image sensor. The proposed method is based on a pinned photodiode (PD)-storage dual-capture operation using a non-fully depleted PD to calibrate the temperature dependent threshold voltage variation of the transfer gate (TG). The prototype CMOS image sensor including a 320 × 240 pixel array with a 2.25 μm pixel pitch has been fabricated using a 0.13 μm CIS technology. The proposed method is found to reduce the FPN of the dual-capture active pixel sensor (APS) by 70 % with a dynamic range of 95 dB in a temperature range of 25 °C to 80 °C.