Statistical moments of scintillation light distribution analysis with dSiPMs and monolithic crystals

Monolithic scintillation crystals offer the possibility to preserve the scintillation light distribution, specially when black painted. Furthermore, the statistical moments of that distribution can provide accurate information about the three spatial components. Nevertheless, for monolithic crystal the moments estimation has an associated error due to the symmetry truncation of the light distribution towards the crystal borders. For the 2-D impact coordinates determination, this error is called compression as it is accentuated near the edges. The computation of all centered moments is, therefore, affected by this error. Digital SiPMs (dSiPMs) can offer complete information about the light distribution, since all cells are purely digital detectors, so that other ways to obtain γ-impact coordinates can be performed. In this work, a comparison between the statistical moments analysis and an alternative fitting the light distribution for each event to a theoretical distribution has been made. With the fitted approach, compression is avoided and an approximately constant spatial resolution is obtained for the entire photodetection area. Moreover, DOI information is improved and preserved all over the crystal.