Experimental Verification of Conductor Loss Model for Thin Film Microstrip Line

This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.