I. Introduction
With the advancement of wide bandgap semiconductors, power devices such as silicon carbide metal-oxide-field-effect transistors (SiC-mosfets) and silicon carbide insulated-gate-bipolar transistors (SiC-IGBTs) are now available with blocking voltages up to 15 kV [1]. A 4H-SiC n-IGBT with a blocking voltage up to 27.5 kV is demonstrated in [2]. Applications which require a blocking voltage of 1.2–10 kV are primarily dominated by SiC mosfets owing to its small on-state resistance [3]. While gate drivers are commercially available for SiC devices with a blocking voltage range of 650–1700 V, there are a very few commercial gate drivers for 10 kV SiC mosfets due to the challenges associated with them [4]. The MV SiC mosfets’ fast switching transients can result in a as high as 100 kV/s, which imposes a requirement for a very low isolation capacitance in the gate drive circuit [5], [6]. Also, the severe stresses reduces the lifetime of the insulation material over time [7].