A Robust Nondestructive Test Scheme Based on Multistage Anode Voltage Detection for 4500 V Single-Cell Turn-Off Capability of Press-Packed Devices

The turn-off capability test for the single cell of power devices is of great significance to both the safe operation assurance and the destruction mechanism research. However, with present techniques, the device under test is supposed to be destroyed once the turn-off fault occurs. In this article, a robust nondestructive test scheme based on the multistage anode voltage detection for 4500 V single-cell turn-off capability of press-packed devices is proposed. Based on the proposed scheme, a single cell of IGCT is tested until a fault occurs. The result proves that a total bypass time is less than 100 ns for the 2200 V/5 A turn-off fault, and thus, the aim of nondestructive tests can be achieved with the proposed method.