FSV: State of the art and current research fronts

FSV, the Feature Selective Validation method, was proposed in order to provide an objective metric to overcome some of the limitations faced by engineers comparing simulation and measurement data `by eye'. Since the early 2000s, it has become a commonly used technique in the EMC community and one of the earlier papers, or the IEEE Standard 1597.1 which specifically includes FSV, is frequently cited in the IEEE Transactions on EMC. This paper describes the current state of the art of the FSV method, particularly noting the developments in approximately the last decade that have enhanced the method and added to its generality. The paper also discusses areas that are the topics of current and future research.