A NIST perspective on metrology and EMC challenges for 5G and beyond

Wireless connectivity, the internet of things, smart technologies and applications will all create new EMC challenges, in both expected and unexpected forms. Traceable metrology needs to be developed, both to characterize and optimize these future systems, and to minimize interference and EMC problems. This paper looks at metrology and EMC challenges related to 5G and beyond communications, and what NIST is doing towards solutions.