Fuse-Based Field-Dispensable ESD Protection for Ultra-High-Speed ICs

We report the first fuse-based field-dispensable electrostatic discharging (ESD) protection structure to eliminate the ESD-induced parasitics, hence, enable ultrahigh-speed ICs with robust ESD protection. Silicon results validate the new ESD protection concept for more than 20 Gb/s ICs in a 28-nm CMOS.