I. Introduction
Single-photon detectors such as single-photon avalanche diodes (SPAD) or silicon photomultipliers (SiPM) [1] are widely used in quantum optics [2], time-of-flight ranging [3], Raman spectroscopy and fluorescence lifetime measurements [4], etc. These applications raise great demands on efficient methods for evaluating the photon detection efficiency (PDE), dark count rate (DCR), and afterpulsing of the detectors, and the temporal distribution of echo pulses which is relevant to the time performance of the electronics. Among these, the average detected photons is a crucial parameter for detectors’ PDE characterization [5], which is usually obtained by means of counter [6], photocurrent analysis [7], oscilloscope [8], digitizers or charge-to-digital converter (QDC) [9]. These techniques require complete waveform details of the single-photon signals, normally collected by analog-to-digital converters (ADC) with high resolution and conversion rate. Therefore, the volume of collected data is usually substantial.