I. INTRODUCTION
Imaging of metallic objects has a wide range of applications in infrastructure imaging (e.g., see Szymanik [2016]), nondestructive testing (e.g., see Darrer [2015a]), security screening (e.g., see Ledger [2015]), biomedical imaging (e.g., see Gogola [2013]), etc. In a common imaging technique, called electromagnetic induction imaging (EII) [Peyton 1996], electromagnetic waves with sufficiently low frequency are employed to illuminate the medium under inspection. The use of low frequencies allows for penetration inside the medium and producing eddy currents on the surface of hidden metallic objects. These eddy currents, in turn, produce secondary electromagnetic fields that reflect back toward the transmitter. These secondary electromagnetic fields carry information about the type, size, and shape of the hidden metallic objects.