Functional Broadside Tests Under Broadcast Scan

Under broadcast scan, scan chains are partitioned into groups that receive the same scan-in values. This article considers, for the first time, the application of functional broadside tests under broadcast scan. This article provides a definition of a close-to-functional broadside test that is applicable under a broadcast scan configuration. The test is referred to as a group-functional broadside test. This article describes how a subset of group-functional broadside tests is obtained from a functional broadside test and discusses the proximity to functional operation conditions that a group-functional broadside test maintains. It also describes the generation of a group-functional broadside test set. The experimental results for transition faults in benchmark circuits explore the tradeoff between the level of test data compression, the proximity to functional operation conditions, and the transition fault coverage, by considering scan configurations with different numbers of scan chains.