Variation-Aware Modeling of Integrated Capacitors Based on Floating Random Walk Extraction

This paper presents an effective approach to variability analysis of integrated capacitors due to manufacturing process uncertainty. The proposed approach combines the generalized polynomial chaos method for uncertainty quantification with the efficient floating random walk algorithm for capacitance extraction. For applications where detailed statistical descriptions are required, the method allows achieving a
$1000 {\times }$
acceleration compared to standard Monte Carlo analysis. Application to variability analysis in digital to analog converters is illustrated.