A Talbot–Lau X-Ray Deflectometer as a High-Energy Density Plasma Diagnostic

We present the development and advancement of the Talbot-Lau X-ray deflectometry (TXD) single-image phase-retrieval technique, for high-energy density (HED) plasma diagnostics. The Talbot-Lau interferometer has been benchmarked as an electron density diagnostic for low-Z objects (Z <; 13) at the X-ray energies of 8 and 17 keV. A laser driven X-ray backlighter was used at the multi-tera watt laser facility in order to obtain electron density measurements. We measured X-ray refraction and retrieved sharp and smooth density gradients with source-limited spatial resolution. Since TXD can use extended, incoherent, line, or continuum X-ray sources, a wide range of X-ray backlighters can be used, driven from laser or pulsed power systems. Laboratory results indicate potential for simultaneous retrieval of: electron density maps through refraction and attenuation, material mixing through elemental composition, and instabilities through scatter images. Experiments using a 17-keV backlighter to characterize a planar shock are planned to test the TXD technique on an HED plasma environment.